This test should only be performed after the DS1 media module and the 120A ICSU have been successfully tested using appropriate maintenance procedures. The DS1 span test consists of 2 sequential parts. Each part provides a result indicating if there is a problem in the CPE wiring. CPE wiring may be considered problem-free only if the results of both parts are successful.
The first part of the span test powers-up the loopback jack and attempts to send a simple code from the DS1 board, through the wiring and loopback jack, and back to the DS1 board. Maintenance software waits about 10 seconds for the loopback jack to loop, sends the indication of the test results to the management terminal, and proceeds to the second part of the test.
The second part of the test sends the standard DS1 3-in-24 stress testing pattern from the DS1 board, through the loopback jack, and back to a bit error detector and counter on the DS1 board. The bit error rate counter may be examined on the management terminal, and provides the results of the second part of the test. The test remains in this state until it is terminated so that the CPE wiring may be bit error rate tested for as long as needed.